STM OBSERVATIONS OF ELECTRODEPOSITED COPPER UNDER POTENTIAL CONTROL AND OPEN CIRCUIT

被引:15
作者
ARMSTRONG, MJ [1 ]
MULLER, RH [1 ]
机构
[1] UNIV CALIF BERKELEY,COLL CHEM,DEPT CHEM ENGN,BERKELEY,CA 94720
关键词
D O I
10.1149/1.2096690
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:584 / 585
页数:2
相关论文
共 7 条
[1]  
DEAN MH, 1988, 173RD EL SOC M ATL
[2]   SCANNING TUNNELING MICROSCOPY OF PROCESSES AT LIQUID SOLID INTERFACES [J].
DRAKE, B ;
SONNENFELD, R ;
SCHNEIR, J ;
HANSMA, PK .
SURFACE SCIENCE, 1987, 181 (1-2) :92-97
[3]   THE APPLICATION OF SCANNING TUNNELING MICROSCOPY TO INSITU STUDIES OF NICKEL ELECTRODES UNDER POTENTIAL CONTROL [J].
LEV, O ;
FAN, FR ;
BARD, AJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (03) :783-784
[4]  
MCCORMICK LD, 1988, 173RD EL SOC M ATL
[5]  
NI CL, 1988, 173RD EL SOC M ATL
[6]   TUNNELING MICROSCOPY IN AN ELECTROCHEMICAL-CELL - IMAGES OF AG-PLATING [J].
SONNENFELD, R ;
SCHARDT, BC .
APPLIED PHYSICS LETTERS, 1986, 49 (18) :1172-1174
[7]  
WIECHERS T, 1988, J ELECTROANAL CHEM, V248, P451