APPARATUS FOR MEASUREMENT OF HALL EFFECT IN SEMICONDUCTORS OF LOW MOBILITY AND HIGH RESISTIVITY

被引：22

作者：

HERMANN, AM

HAM, JS

机构：

来源：

关键词：

D O I：

10.1063/1.1719390

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1553 / &

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[6]

HERMANN AM, TO BE PUBLISHED

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