SMALL-ANGLE NEUTRON-SCATTERING STUDY OF SEMICONDUCTOR MICROCRYSTALLITES IN OPTICAL-GLASSES

被引：29

作者：

DEGIORGIO, V

BANFI, G

RIGHINI, G

RENNIE, A

机构：

[1] IST RIC ONDE ELETTROMAGNET,I-50127 FLORENCE,ITALY

[2] INST MAX VON LAUE PAUL LANGEVIN,F-38042 GRENOBLE,FRANCE

来源：

APPLIED PHYSICS LETTERS | 1990年 / 57卷 / 27期

关键词：

D O I：

10.1063/1.103764

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The structure of semiconductor-doped glasses is studied by small-angle neutron scattering. We derive the average size of the microcrystals, and we give information on the spatial distribution of the microcrystals. A new aspect emerging from our data is the existence of a depletion region that during nucleation and growth each crystal creates around itself.

引用

页码：2879 / 2881

页数：3

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