REAL-TIME DISPLACEMENT AND TILT ANALYSIS BY A SPECKLE TECHNIQUE USING BI12SIO20-CRYSTALS

被引：52

作者：

TIZIANI, HJ

LEONHARDT, K

KLENK, J

机构：

来源：

OPTICS COMMUNICATIONS | 1980年 / 34卷 / 03期

关键词：

D O I：

10.1016/0030-4018(80)90388-0

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：327 / 331

页数：5

共 9 条

[1]

ENNOS AE, 1975, LASER SPECKLE RELATE, P237

[2] SOME POLARIZATION PROPERTIES OF VOLUME HOLOGRAMS IN BI12SIO20 CRYSTALS AND APPLICATIONS [J].

HERRIAU, JP ;

HUIGNARD, JP ;

AUBOURG, P .

APPLIED OPTICS, 1978, 17 (12) :1851-1852

[3] TIME AVERAGE HOLOGRAPHIC-INTERFEROMETRY WITH PHOTOCONDUCTIVE ELECTROOPTIC BI12SIO20 CRYSTALS [J].

HUIGNARD, JP ;

HERRIAU, JP ;

VALENTIN, T .

APPLIED OPTICS, 1977, 16 (11) :2796-2798

[4] HIGH-SENSITIVITY READ-WRITE VOLUME HOLOGRAPHIC STORAGE IN BI12SIO20 AND BI12GEO20 CRYSTALS [J].

HUIGNARD, JP ;

MICHERON, F .

APPLIED PHYSICS LETTERS, 1976, 29 (09) :591-593

[5] PHASE-CONJUGATION AND SPATIAL-FREQUENCY DEPENDENCE OF WAVE-FRONT REFLECTIVITY IN BI12SIO20 CRYSTALS [J].

HUIGNARD, JP ;

HERRIAU, JP ;

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GUNTER, P .

OPTICS LETTERS, 1980, 5 (03) :102-104

[6]

HUIGNARD JP, 1977, APPL OPTICS, V16, P1897

[7] COUPLED WAVE THEORY FOR THICK HOLOGRAM GRATINGS [J].

KOGELNIK, H .

BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (09) :2909-+

[8] LIGHT-DIFFRACTION AND NON-LINEAR IMAGE-PROCESSING IN ELECTROOPTIC BI12SIO20 CRYSTALS [J].

PETROV, MP ;

MIRIDONOV, SV ;

STEPANOV, SI ;

KULIKOV, VV .

OPTICS COMMUNICATIONS, 1979, 31 (03) :301-305

[9]

TIZIANI HJ, 1978, SPECKLE METROLOGY, P73

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