Thin disk dielectric film capacitors were prepared from a series of special monodisperse polystyrenes and irradiated in a flash X-ray facility. Transient conductivity in the films was measured with time resolution as 5 ns, for dose rates from 107 to 5x1010 rad/see and related to a kinetic model dominated by carrier trapping. Estimates for constants associated with a class of shallow traps were obtained for the assumed model. No significant molecular weight dependence of the early-time induced conductivity was found. Molecular weight-dependent departures from second order decay kinetics were noted. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.