SYMMETRY ANALYSIS

被引：31

作者：

TANAKA, M

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1989年 / 13卷 / 01期

关键词：

D O I：

10.1002/jemt.1060130106

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：27 / 39

页数：13

共 22 条

[1] SYMMETRY OF ELECTRON-DIFFRACTION ZONE AXIS PATTERNS [J].

BUXTON, BF ;

EADES, JA ;

STEEDS, JW ;

RACKHAM, GM .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 281 (1301) :171-+

[2]

EADES JA, 1988, P MICROBEAM ANAL

[3]

EADES JA, 1988, 9TH P EUR C EL MICR

[4] EXTINCTION CONDITIONS IN DYNAMIC THEORY OF ELECTRON DIFFRACTION [J].

GJONNES, J ;

MOODIE, AF .

ACTA CRYSTALLOGRAPHICA, 1965, 19 :65-&

[5] BLOCH WAVE SYMMETRIES AND INCLINED SURFACES [J].

GJONNES, J ;

GJONNES, K .

ULTRAMICROSCOPY, 1985, 18 (1-4) :77-82

[6] IDENTIFICATION OF ENANTIOMORPHICALLY-RELATED SPACE GROUPS BY ELECTRON-DIFFRACTION - 2ND METHOD [J].

GOODMAN, P ;

JOHNSON, AWS .

ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (NOV) :997-&

[7] IDENTIFICATION OF ENANTIOMORPHOUSLY RELATED SPACE GROUPS BY ELECTRON-DIFFRACTION [J].

GOODMAN, P ;

SECOMB, TW .

ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1) :126-&

[8] A RETABULATION OF THE 80 LAYER GROUPS FOR ELECTRON-DIFFRACTION USAGE [J].

GOODMAN, P .

ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 (NOV) :635-642

[9]

GOODMAN P, 1975, ACTA CRYSTALLOGR A, V31, P894

[10] SPACE-GROUP ANALYSES OF THIN PRECIPITATES BY DIFFERENT CONVERGENT-BEAM ELECTRON-DIFFRACTION PROCEDURES [J].

HOWE, JM ;

SARIKAYA, M ;

GRONSKY, R .

ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 :368-380

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