AMORPHOUS MATERIALS - POSSIBLE CONTRIBUTIONS OF MOSSBAUER SPECTROMETRY .6. STUDY BY MOSSBAUER SPECTROMETRY OF AMORPHOUS METALLIC ALLOYS AND AMORPHOUS-SEMICONDUCTORS

被引：1

作者：

LECAER, G

DUBOIS, JM

机构：

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1980年 / 15卷 / 06期

关键词：

D O I：

10.1051/rphysap:019800015060104900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1049 / 1056

页数：8

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