SURFACE COMPOSITIONAL ANALYSIS USING LOW ENERGY ION-BOMBARDMENT INDUCED EMISSION PROCESSES

[1] ION MICROPROBE MASS ANALYZER [J]. SCIENCE, 1972, 175 (4024) : 853 - +

[2] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438

[3] ANDERSEN CA, 1969, INT J MASS SPECTROM, V2, P61

[4] ARIFOV UA, 1963, AECTR6089US AT EN CO

[5] EXTENSION OF ELECTRON-PROMOTION MODEL TO ASYMMETRIC ATOMIC COLLISION [J]. PHYSICAL REVIEW A, 1972, 6 (01): : 211 - &

[6] TANDEM MASS SPECTROMETER FOR SECONDARY ION STUDIES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (01) : 49 - +

[7] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .4. OXIDATION OF MAGNESIUM, STRONTIUM, AND BARIUM IN MONOLAYER RANGE [J]. SURFACE SCIENCE, 1974, 41 (02) : 483 - 492

[8] INVESTIGATION OF SURFACE OXIDATION OF METALS IN SUB-MONOLAYER AND MONOLAYER RANGE WITH STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY [J]. THIN SOLID FILMS, 1972, 12 (02) : 439 - +

[9] BENNINGHOVEN A, 1973, SURF SCI, V35, P927

[10] Beske H. E., 1971, International Journal of Mass Spectrometry and Ion Physics, V7, P111, DOI 10.1016/0020-7381(71)80032-3

[1] ION MICROPROBE MASS ANALYZER [J]. SCIENCE, 1972, 175 (4024) : 853 - +

[2] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438

[3] ANDERSEN CA, 1969, INT J MASS SPECTROM, V2, P61

[4] ARIFOV UA, 1963, AECTR6089US AT EN CO

[5] EXTENSION OF ELECTRON-PROMOTION MODEL TO ASYMMETRIC ATOMIC COLLISION [J]. PHYSICAL REVIEW A, 1972, 6 (01): : 211 - &

[6] TANDEM MASS SPECTROMETER FOR SECONDARY ION STUDIES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (01) : 49 - +

[7] INVESTIGATION OF SURFACE-REACTIONS BY STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .4. OXIDATION OF MAGNESIUM, STRONTIUM, AND BARIUM IN MONOLAYER RANGE [J]. SURFACE SCIENCE, 1974, 41 (02) : 483 - 492

[8] INVESTIGATION OF SURFACE OXIDATION OF METALS IN SUB-MONOLAYER AND MONOLAYER RANGE WITH STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY [J]. THIN SOLID FILMS, 1972, 12 (02) : 439 - +

[9] BENNINGHOVEN A, 1973, SURF SCI, V35, P927

[10] Beske H. E., 1971, International Journal of Mass Spectrometry and Ion Physics, V7, P111, DOI 10.1016/0020-7381(71)80032-3