X-RAY DETERMINATION OF THE POLARITY OF ZINCBLENDE-STRUCTURE CRYSTALS

[1] [Anonymous], 1974, INT TABLES XRAY CRYS, VIV

[2] CHARACTERIZATION OF THIN-LAYERS ON PERFECT CRYSTALS WITH A MULTIPURPOSE HIGH-RESOLUTION X-RAY DIFFRACTOMETER [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02): : 338 - 345

[3] DIE DIFFRACTION PATTERN DES IDEALKRISTALLS FUR RONTGENSTRAHLINTERFERENZEN IM BRAGG-FALL [J]. ACTA CRYSTALLOGRAPHICA, 1967, 23 : 507 - &

[4] EFFECT OF CRYSTAL PERFECTION AND POLARITY ON ABSORPTION EDGES SEEN IN BRAGG DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (07) : 2227 - &

[5] Differences in the Intensity of X-Ray Reflection from the two 111-surfaces of Sphalerite [J]. ZEITSCHRIFT FUR PHYSIK, 1930, 63 (5-6): : 345 - 369

[6] CRYSTALLOGRAPHIC POLARITY AND ETCHING OF CADMIUM TELLURIDE [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (08) : 4668 - 4670

[7] INTENSITY OF X-RAY REFLEXION FROM PERFECT AND MOSAIC ABSORBING CRYSTALS [J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (03): : 187 - 194

[8] Zachariasen W. H., 1945, THEORY XRAY DIFFRACT

[1] [Anonymous], 1974, INT TABLES XRAY CRYS, VIV

[2] CHARACTERIZATION OF THIN-LAYERS ON PERFECT CRYSTALS WITH A MULTIPURPOSE HIGH-RESOLUTION X-RAY DIFFRACTOMETER [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02): : 338 - 345

[3] DIE DIFFRACTION PATTERN DES IDEALKRISTALLS FUR RONTGENSTRAHLINTERFERENZEN IM BRAGG-FALL [J]. ACTA CRYSTALLOGRAPHICA, 1967, 23 : 507 - &

[4] EFFECT OF CRYSTAL PERFECTION AND POLARITY ON ABSORPTION EDGES SEEN IN BRAGG DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (07) : 2227 - &

[5] Differences in the Intensity of X-Ray Reflection from the two 111-surfaces of Sphalerite [J]. ZEITSCHRIFT FUR PHYSIK, 1930, 63 (5-6): : 345 - 369

[6] CRYSTALLOGRAPHIC POLARITY AND ETCHING OF CADMIUM TELLURIDE [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (08) : 4668 - 4670

[7] INTENSITY OF X-RAY REFLEXION FROM PERFECT AND MOSAIC ABSORBING CRYSTALS [J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (03): : 187 - 194

[8] Zachariasen W. H., 1945, THEORY XRAY DIFFRACT