APPLICATIONS OF FACTOR-ANALYSIS TO ELECTRON AND ION-BEAM SURFACE TECHNIQUES

[1] PRINCIPAL COMPONENT ANALYSIS AS A METHOD FOR SILICIDE INVESTIGATION WITH AUGER-ELECTRON SPECTROSCOPY [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02): : 489 - 496

[2] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625

[3] SIMS STUDIES OF ADSORPTION OF O-2, CO AND CO2 ON TITANIUM USING LOW PRIMARY ENERGIES [J]. SURFACE SCIENCE, 1977, 65 (01) : 41 - &

[4] PRINCIPAL COMPONENT ANALYSIS OF AUGER LINE-SHAPES AT SOLID-SOLID INTERFACES [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 7 - 18

[5] CHEMICAL CHARACTERIZATION FROM CARBON AUGER-SPECTRA BY APPLICATION OF PATTERN-RECOGNITION AND FACTOR-ANALYSIS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 600 - 604

[6] GAARENSTROOM SW, 1982, J VAC SCI TECHNOL, V20, P2458

[7] GAARENSTROOM SW, 1985, MAY S SURF ANAL THIN

[8] APPLICATION OF FACTOR-ANALYSIS TO THE RESOLUTION OF OVERLAPPING XPS SPECTRA [J]. APPLIED SPECTROSCOPY, 1982, 36 (04) : 428 - 430

[9] FACTOR-ANALYSIS FOR SEPARATION OF PURE COMPONENT SPECTRA FROM MIXTURE SPECTRA [J]. ANALYTICAL CHEMISTRY, 1983, 55 (04) : 630 - 633

[10] KAUN TS, 1983, J APPL PHYS, V54, P6952

[1] PRINCIPAL COMPONENT ANALYSIS AS A METHOD FOR SILICIDE INVESTIGATION WITH AUGER-ELECTRON SPECTROSCOPY [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02): : 489 - 496

[2] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625

[3] SIMS STUDIES OF ADSORPTION OF O-2, CO AND CO2 ON TITANIUM USING LOW PRIMARY ENERGIES [J]. SURFACE SCIENCE, 1977, 65 (01) : 41 - &

[4] PRINCIPAL COMPONENT ANALYSIS OF AUGER LINE-SHAPES AT SOLID-SOLID INTERFACES [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 7 - 18

[5] CHEMICAL CHARACTERIZATION FROM CARBON AUGER-SPECTRA BY APPLICATION OF PATTERN-RECOGNITION AND FACTOR-ANALYSIS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 600 - 604

[6] GAARENSTROOM SW, 1982, J VAC SCI TECHNOL, V20, P2458

[7] GAARENSTROOM SW, 1985, MAY S SURF ANAL THIN

[8] APPLICATION OF FACTOR-ANALYSIS TO THE RESOLUTION OF OVERLAPPING XPS SPECTRA [J]. APPLIED SPECTROSCOPY, 1982, 36 (04) : 428 - 430

[9] FACTOR-ANALYSIS FOR SEPARATION OF PURE COMPONENT SPECTRA FROM MIXTURE SPECTRA [J]. ANALYTICAL CHEMISTRY, 1983, 55 (04) : 630 - 633

[10] KAUN TS, 1983, J APPL PHYS, V54, P6952