HIGH-RESOLUTION STRAIN-MEASUREMENTS BY DIRECT OBSERVATION IN THE SCANNING ELECTRON-MICROSCOPE

被引:5
作者
KORTSCHOT, MT [1 ]
机构
[1] UNIV CAMBRIDGE,DEPT ENGN,CAMBRIDGE CB2 1PZ,ENGLAND
关键词
Strain Amplification;
D O I
10.1007/BF01106822
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A technique for measuring strain with an accuracy of ±100 μΕ by direct observation in the scanning electron microscope has been developed and tested. The technique involves placing a fine metallic mesh loosely on the surface of a tensile coupon and observing the motion of the surface with respect to this mesh. It was evaluated by tensile loading of aluminum and carbon fiber-reinforced epoxy specimens for strains up to 600 μΕ using an instrumented miniature loading stage. Applications and limitations of the technique have been discussed.
引用
收藏
页码:3970 / 3972
页数:3
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