ELECTRICAL RELAXATION IN NA2O3SIO2 GLASS

被引:279
作者
PROVENZANO, V
MACEDO, PB
VOLTERRA, V
BOESCH, LP
MOYNIHAN, CT
机构
关键词
D O I
10.1111/j.1151-2916.1972.tb13413.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:492 / +
页数:1
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[1]  
AMBRUS JH, TO BE PUBLISHED
[2]   LOW FREQUENCY BRIDGE FOR GUARDED 3-TERMINAL AND 4-TERMINAL MEASUREMENTS OF ADMITTANCE [J].
BERBERIAN, JG ;
COLE, RH .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :811-+
[3]   ELECTROLYTIC CONDUCTANCE MEASUREMENTS AND CAPACITIVE BALANCE [J].
BRAUNSTEIN, J ;
ROBBINS, GD .
JOURNAL OF CHEMICAL EDUCATION, 1971, 48 (01) :52-+
[4]   POLARIZATION AND DIFFUSION IN A SILICATE GLASS [J].
CHARLES, RJ .
JOURNAL OF APPLIED PHYSICS, 1961, 32 (06) :1115-&
[5]   A WIDE RANGE CAPACITANCE-CONDUCTANCE BRIDGE [J].
COLE, RH ;
GROSS, PM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (04) :252-260
[6]   RELATION OF ALKALI MOBILITY AND MECHANICAL RELAXATION IN MIXED-ALKALI SILICATE-GLASSES [J].
FLEMING, JW ;
DAY, DE .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1972, 55 (04) :186-&
[7]  
HAKIM RM, 1971, PHYS CHEM GLASSES, V12, P132
[8]  
HAVEN Y, 1965, PHYS CHEM GLASSES, V6, P38
[9]   MECHANICAL AND IONIC RELAXATION IN NA2O3SIO2 GLASS [J].
HIGGINS, TJ ;
VOLTERRA, V ;
MACEDO, PB .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1972, 55 (10) :488-&
[10]  
HOWELL FS, 1972, THESIS CATHOLIC U AM