WETTING PROCESSES ON A CONTAMINATED INSULATOR SURFACE

被引:17
作者
LECLERC, M
BOUCHARD, RP
GERVAIS, Y
MUKHEDKAR, D
机构
来源
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1982年 / 101卷 / 05期
关键词
D O I
10.1109/TPAS.1982.317352
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1005 / 1011
页数:7
相关论文
共 11 条
[1]  
CHERNEY EA, IEEE A781174
[2]  
JOLLY DC, 1972, IEEE POWER APPARATUS, V91
[3]   EFFECT OF FOG PARAMETERS ON TESTING OF ARTIFICIALLY CONTAMINATED INSULATORS IN A FOG CHAMBER [J].
KARADY, G .
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1975, PA94 (02) :378-387
[4]  
KAWAI M, J FRANKLIN I, V294, P399
[5]  
KAWAMURA T, IEEE C
[6]   INSULATORS WITH CONTAMINATED SURFACES .1. FIELD CONDITIONS AND THEIR LABORATORY SIMULATION [J].
MCELROY, AJ ;
LYON, WJ ;
PHELPS, JDM ;
WOODSON, HH .
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1970, PA89 (08) :1848-&
[7]  
SFORZINI M, J FRANKLIN I, V294, P437
[8]  
WILLIAMS LJ, IEEE T740691 PAP
[9]  
ZARZOURA HEM, IEEE A781216
[10]  
1979, CIGRE33 GROUP TRAV 0