DEVICE FOR DETERMINATION OF CHARGED-PARTICLE BEAM PROFILE AND POSITION

被引：5

作者：

PRUDNIKO.IA ^{[1
]}

TOROPOV, AS ^{[1
]}

CHICHIKA.YF ^{[1
]}

KHOKHRYA.IV ^{[1
]}

机构：

[1] DV EFREMOV SCI RES ELECTROPHYS APPARAT INST,LENINGRAD,USSR

来源：

NUCLEAR INSTRUMENTS & METHODS | 1974年 / 114卷 / 01期

关键词：

D O I：

10.1016/0029-554X(74)90336-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：101 / 104

页数：4

共 8 条

[1] A SECONDARY EMISSION MONITOR FOR ELECTRON BEAMS OF HIGH ENERGY AND INTENSITY
BALSAMO, EP
GUARALDO, C
SCRIMAGLIO, R
[J]. NUCLEAR INSTRUMENTS & METHODS, 1967, 55 (02): : 339 - +
[2] WIDE APERTURE HIGH GAIN BEAM PROFILE SCANNER
BOND, CD
GORDON, SE
[J]. NUCLEAR INSTRUMENTS & METHODS, 1972, 98 (03): : 513 - &
[3] BEAM PROFILE MEASUREMENT FOR ELECTRON ACCELERATORS
OKABE, S
TABATA, T
TSUMORI, K
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1966, 5 (01) : 68 - &
[4] A 10-CHANNEL SECUNDARY EMISSION MONITOR FOR ELECTRON BEAM ANALYZING PURPOSES
PICENI, HAL
DEVRIES, C
[J]. NUCLEAR INSTRUMENTS & METHODS, 1967, 51 (01): : 87 - &
[5] RAQUET E, 1969, DESY6912 REP
[6] RIGAN J, 1966, REV SCI INSTR, V37, P1190
[7] VJALITSIN VA, 1967, PRIBORI TEHNIKA EKSP, P36
[8] VONILLOT IM, 1971, CERNISROP7154 REP