MAGNETIC SOFTNESS OF FE-1.5 WT-PERCENT-SI SINGLE-CRYSTAL FILMS DEPOSITED ON GAAS(111)

被引：2

作者：

HOSONO, A

SHIMADA, Y

机构：

[1] Research Institute for Scientific Measurements, Tohoku University, Sendai

[2] On leave from the Research institute for Scientific Measurements, Tohoku University

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1991年 / 30卷 / 7A期

关键词：

THIN FILM; MAGNETIC SOFTNESS; SINGLE CRYSTAL; CRYSTAL ORIENTATION; FE-SI; GAAS; PERMEABILITY;

D O I：

10.1143/JJAP.30.L1169

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The magnetic softness of Fe-1.5 wt.%Si single-crystal films with (111) orientation was investigated. Fe-1.5 wt.%Si films deposited on GaAs (111) single-crystal substrates grow epitaxially with good (111) orientation parallel to the film plane. Coercivities of the Fe-1.5 wt.%Si films decrease as the film thickness decreases. A 300 angstrom-thick film exhibits coercivity of 0.7 Oe. The permeability of a 1000 angstrom thick film is 1400.

引用

页码：L1169 / L1171

页数：3