WELL DEPTHS OF XEF- AND XECL- FROM DIFFERENTIAL SCATTERING MEASUREMENTS

被引:13
作者
DEVREUGD, C
WIJNAENDTSVANRESANDT, RW
LOS, J
机构
关键词
D O I
10.1016/0009-2614(79)80134-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Elastic differential cross section measurements were performed for F- + Xe and Cl- + Xe in an energy range of 250-500 eV and in an angular range of 0-6 mrad. In contrast to the case of C1- on Xe, the rainbow structure in the cross section for F- on Xe was well resolved. From the measurements the well depth of XeF- has been determined to be 0.28 ± 0.04 eV, while for XeC1- the well depth should be less than 0.14 eV. © 1979.
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页码:93 / 94
页数:2
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