DETERMINATION OF KONDO SCATTERING-AMPLITUDE AND COHERENCE DISTANCE FROM TUNNELING IN DOPED-ELECTRODE JUNCTIONS

被引：20

作者：

BERMON, S ^{[1
]}

SO, CK ^{[1
]}

机构：

[1] CUNY,CITY COLL,DEPT PHYS,NEW YORK,NY 10031

来源：

PHYSICAL REVIEW LETTERS | 1978年 / 40卷 / 01期

关键词：

D O I：

10.1103/PhysRevLett.40.53

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：53 / 56

页数：4

相关论文

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