STUDY OF KIKUCHI PSEUDOLINES OBSERVED IN SCANNING ELECTRON MICROSCOPY

被引：20

作者：

VICARIO, E

PITAVAL, M

FONTAINE, G

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1971年 / A 27卷 / JAN1期

关键词：

D O I：

10.1107/S0567739471000019

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：1 / &

共 16 条

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[2] SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J].

BOOKER, GR ;

SHAW, AMB ;

WHELAN, MJ ;

HIRSCH, PB .

PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1185-&

[3] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J].

COATES, DG .

PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1179-&

[4] A METHOD TO DETERMINE RATIO BETWEEN LATTICE PARAMETER AND ELECTRON WAVELENGTH FROM KIKUCHI LINE INTERSECTIONS [J].

HOIER, R .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 :516-&

[5]

James R., 1962, OPTICAL PRINCIPLES D

[6]

PITAVAL, 1970, SEP C INT MICR EL GR

[7] OPTIMUM CONDITIONS FOR GENERATING CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPE [J].

SCHULSON, EM ;

VANESSEN, CG .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (03) :247-&

[8] FURTHER COMMENTS ON ORIGIN OF ORIENTATION-DEPENDENT PATTERNS OBTAINED IN SCANNING ELECTRON MICROSCOPE [J].

SHAW, AMB ;

BOOKER, GR ;

COATES, DG .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (03) :243-&

[9]

SHINOHARA, 1935, PHYS REV, V47, P730

[10]

VANNIEUWENHUYZE F, 1969, CR ACAD SCI B PHYS, V268, P1409

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