STUDY ON THE STICK-SLIP PHENOMENON ON A CLEAVED SURFACE OF THE MUSCOVITE MICA USING AN ATOMIC-FORCE LATERAL FORCE MICROSCOPE

被引:16
作者
FUJISAWA, S [1 ]
SUGAWARA, Y [1 ]
MORITA, S [1 ]
ITO, S [1 ]
MISHIMA, S [1 ]
OKADA, T [1 ]
机构
[1] OLYMPUS OPT CO LTD,RES DEPT,HACHIOJI 192,JAPAN
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期
关键词
D O I
10.1116/1.587249
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Study was performed on the stick-slip phenomenon between the Muscovite mica and a cantilever tip. An atomic force/lateral force microscope with an optical lever deflection method was used, which detects the deflection and the torsion of the cantilever simultaneously. We observed the square-wave behavior across the scan direction, but the well-known sawtooth behavior due to the stick-slip motion of the tip along the scan direction. It is found that the square-wave and sawtooth behaviors were synchronized with each other. To explain these behaviors, we propose two-dimensional stick-slip model. In this model, the periodicity of the stick point is the same of that of the lattice structure of the mica surface, so that the tip apex takes a zig-zag walk along the scan.
引用
收藏
页码:1635 / 1637
页数:3
相关论文
共 10 条
[1]   IMPROVED ATOMIC FORCE MICROSCOPE IMAGES USING MICROCANTILEVERS WITH SHARP TIPS [J].
AKAMINE, S ;
BARRETT, RC ;
QUATE, CF .
APPLIED PHYSICS LETTERS, 1990, 57 (03) :316-318
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   ATOMIC SCALE FRICTION BETWEEN THE MUSCOVITE MICA CLEAVAGE PLANE AND A TUNGSTEN TIP [J].
ERLANDSSON, R ;
HADZIIOANNOU, G ;
MATE, CM ;
MCCLELLAND, GM ;
CHIANG, S .
JOURNAL OF CHEMICAL PHYSICS, 1988, 89 (08) :5190-5193
[4]  
FUJISAWA S, IN PRESS MICROBEAM A
[5]   ATOMIC-SCALE CONTRAST MECHANISM IN ATOMIC FORCE MICROSCOPY [J].
HEINZELMANN, H ;
MEYER, E ;
BRODBECK, D ;
OVERNEY, G ;
GUNTHERODT, HJ .
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1992, 88 (03) :321-326
[6]   Combined scanning force and friction microscopy of mica [J].
Marti, O. ;
Colchero, J. ;
Mlynek, J. .
Nanotechnology, 1990, 1 (02) :141-144
[7]   ATOMIC-SCALE FRICTION OF A TUNGSTEN TIP ON A GRAPHITE SURFACE [J].
MATE, CM ;
MCCLELLAND, GM ;
ERLANDSSON, R ;
CHIANG, S .
PHYSICAL REVIEW LETTERS, 1987, 59 (17) :1942-1945
[8]   SIMULTANEOUS MEASUREMENT OF LATERAL AND NORMAL FORCES WITH AN OPTICAL-BEAM-DEFLECTION ATOMIC FORCE MICROSCOPE [J].
MEYER, G ;
AMER, NM .
APPLIED PHYSICS LETTERS, 1990, 57 (20) :2089-2091
[9]   ANOMALOUS CORRUGATION HEIGHT OF ATOMICALLY RESOLVED AFM IMAGES OF A GRAPHITE SURFACE [J].
SUGAWARA, Y ;
ISHIZAKA, T ;
MORITA, S ;
IMAI, S ;
MIKOSHIBA, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1990, 29 (03) :L502-L504
[10]  
Wyckoff R. W. G., 1951, CRYSTAL STRUCTURES, V2