THE EFFECT OF HEAT-TREATMENT ON THE STRUCTURAL-PROPERTIES OF ELECTRON-BEAM-EVAPORATED SNO2 FILMS

被引：46

作者：

REDDY, MHM

JAWALEKAR, SR

CHANDORKAR, AN

机构：

来源：

THIN SOLID FILMS | 1989年 / 169卷 / 01期

关键词：

D O I：

10.1016/S0040-6090(89)80010-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：117 / 126

页数：10

共 14 条

[1]

AKOI A, 1970, JPN J APPL PHYS, V9, P582

[2]

[Anonymous], 1967, POWDER DIFFRACTION F

[3]

[Anonymous], 1974, POWDER DIFFRACTION F

[4] TRANSPARENT CONDUCTORS - A STATUS REVIEW [J].

CHOPRA, KL ;

MAJOR, S ;

PANDYA, DK .

THIN SOLID FILMS, 1983, 102 (01) :1-46

[5] PROPERTIES OF ELECTRON-BEAM-EVAPORATED TIN OXIDE-FILMS [J].

DAS, D ;

BANERJEE, R .

THIN SOLID FILMS, 1987, 147 (03) :321-331

[6] STRUCTURE, PHOTO-VOLTAIC PROPERTIES, AND ANGLE-OF-INCIDENCE CORRELATIONS OF ELECTRON-BEAM-DEPOSITED SNO2-IN-SI SOLAR-CELLS [J].

FENG, T ;

GHOSH, AK ;

FISHMAN, C .

JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) :8070-8074

[7] SNO FILMS AND THEIR OXIDATION TO SNO2 - RAMAN-SCATTERING, IR REFLECTIVITY AND X-RAY-DIFFRACTION STUDIES [J].

GEURTS, J ;

RAU, S ;

RICHTER, W ;

SCHMITTE, FJ .

THIN SOLID FILMS, 1984, 121 (03) :217-225

[8] CALCULATION OF CARRIER CONCENTRATION IN POLYCRYSTALLINE FILMS AS A FUNCTION OF SURFACE ACCEPTOR STATE DENSITY - APPLICATION FOR ZNO GAS SENSORS [J].

LEARY, DJ ;

BARNES, JO ;

JORDAN, AG .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (06) :1382-1386

[9] AN SNO2 THIN-FILM FOR SENSING ARSINE [J].

MOKWA, W ;

KOHL, D ;

HEILAND, G .

SENSORS AND ACTUATORS, 1985, 8 (02) :101-108

[10]

MURTHY NS, 1984, J I ELECTRON TELECOM, V30, P97

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