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LOW RESISTANCE OHMIC CONTACTS CONTAINING SB TO GAP
被引:3
作者
:
ITOH, M
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
ITOH, M
[
1
]
SUZUKI, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
SUZUKI, S
[
1
]
ITOH, T
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
ITOH, T
[
1
]
YAMAMOTO, Y
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
YAMAMOTO, Y
[
1
]
STEPHENS, KG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
STEPHENS, KG
[
1
]
机构
:
[1]
UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
来源
:
SOLID-STATE ELECTRONICS
|
1980年
/ 23卷
/ 05期
关键词
:
D O I
:
10.1016/0038-1101(80)90080-5
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:447 / 448
页数:2
相关论文
共 4 条
[1]
AVEN M, 1969, OHMIC CONTACTS SEMIC
[2]
Prakash O., 1974, Journal of the Institution of Electronics and Telecommunication Engineers, V20, P153
[3]
REVIEW OF THEORY AND TECHNOLOGY FOR OHMIC CONTACTS TO GROUP III-V COMPOUND SEMICONDUCTORS
RIDEOUT, VL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
RIDEOUT, VL
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(06)
: 541
-
550
[4]
COMPLEX DISTRIBUTION EFFECTS OF THIN COMPONENT OHMIC-CONTACT LAYERS ON GAAS
WEISS, BL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEWCASTLE UPON TYNE,DEPT ELECT & ELECTR ENGN,MERZ LABS,NEWCASTLE UPON TYNE NE1 7,NORTHUMBERLAND,ENGLAND
UNIV NEWCASTLE UPON TYNE,DEPT ELECT & ELECTR ENGN,MERZ LABS,NEWCASTLE UPON TYNE NE1 7,NORTHUMBERLAND,ENGLAND
WEISS, BL
HARTNAGEL, HL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEWCASTLE UPON TYNE,DEPT ELECT & ELECTR ENGN,MERZ LABS,NEWCASTLE UPON TYNE NE1 7,NORTHUMBERLAND,ENGLAND
UNIV NEWCASTLE UPON TYNE,DEPT ELECT & ELECTR ENGN,MERZ LABS,NEWCASTLE UPON TYNE NE1 7,NORTHUMBERLAND,ENGLAND
HARTNAGEL, HL
[J].
ELECTRONICS LETTERS,
1975,
11
(12)
: 263
-
264
←
1
→
共 4 条
[1]
AVEN M, 1969, OHMIC CONTACTS SEMIC
[2]
Prakash O., 1974, Journal of the Institution of Electronics and Telecommunication Engineers, V20, P153
[3]
REVIEW OF THEORY AND TECHNOLOGY FOR OHMIC CONTACTS TO GROUP III-V COMPOUND SEMICONDUCTORS
RIDEOUT, VL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
RIDEOUT, VL
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(06)
: 541
-
550
[4]
COMPLEX DISTRIBUTION EFFECTS OF THIN COMPONENT OHMIC-CONTACT LAYERS ON GAAS
WEISS, BL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEWCASTLE UPON TYNE,DEPT ELECT & ELECTR ENGN,MERZ LABS,NEWCASTLE UPON TYNE NE1 7,NORTHUMBERLAND,ENGLAND
UNIV NEWCASTLE UPON TYNE,DEPT ELECT & ELECTR ENGN,MERZ LABS,NEWCASTLE UPON TYNE NE1 7,NORTHUMBERLAND,ENGLAND
WEISS, BL
HARTNAGEL, HL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEWCASTLE UPON TYNE,DEPT ELECT & ELECTR ENGN,MERZ LABS,NEWCASTLE UPON TYNE NE1 7,NORTHUMBERLAND,ENGLAND
UNIV NEWCASTLE UPON TYNE,DEPT ELECT & ELECTR ENGN,MERZ LABS,NEWCASTLE UPON TYNE NE1 7,NORTHUMBERLAND,ENGLAND
HARTNAGEL, HL
[J].
ELECTRONICS LETTERS,
1975,
11
(12)
: 263
-
264
←
1
→