MICROSCOPIC EVIDENCE FOR PSEUDOEPITAXY IN FCC (100) CO/CU MULTILAYERS

被引：4

作者：

GIRON, F ^{[1
]}

BOHER, P ^{[1
]}

LEDANG, K ^{[1
]}

VEILLET, P ^{[1
]}

机构：

[1] UNIV ORSAY PARIS SUD,INST ELECTR FONDAMENTALE,CNRS,URA 022,F-91405 ORSAY,FRANCE

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1992年 / 4卷 / 31期

关键词：

D O I：

10.1088/0953-8984/4/31/003

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We have grown FCC (100) Co/Cu multilayers on (100) silicon substrates, using a diode-RF sputtering technique. The in-plane texture of the films was studied in situ using reflection high-energy electron diffraction (RHEED). The microscopic layout of the (100) cobalt planes was investigated by means of nuclear magnetic resonance (NMR). PlotS Of the original NMR spectra against the direction of the applied static field are presented as microscopic evidence of a pseudo-epitaxial stack. The RHEED patterns obtained along the [011] and [001] azimuth of the copper planes support this interpretation.

引用

页码：L425 / L428

页数：4

共 6 条

[1] EPITAXY OF (100) CU ON (100) SI BY EVAPORATION NEAR ROOM TEMPERATURES - INPLANE EPITAXIAL RELATION AND CHANNELING ANALYSIS
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[2] DEVIERMAN AEM, 1992, COMMUNICATION
[3] GIRON F, 1992, UNPUB J APPL PHYS
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[6] NMR-STUDY OF INTERFACE STRUCTURE IN EPITAXIAL CO-CU SUPERLATTICES
LEDANG, K
VEILLET, P
HUI, H
LAMELAS, FJ
LEE, CH
CLARKE, R
[J]. PHYSICAL REVIEW B, 1990, 41 (18): : 12902 - 12904

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