YOKE FLUX REVERSAL TIME IN THIN-FILM WRITE HEADS

被引：10

作者：

KLAASSEN, KB

VANPEPPEN, JCL

机构：

[1] IBM Research Division, Almaden Research Center, San Jose

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1995年 / 31卷 / 06期

关键词：

D O I：

10.1109/20.490083

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A simple method is described for measuring the time dependency of the magnetization reversal process in the yoke of thin-film inductive write heads. Measurement results are given for an experimental head, showing close agreement with earlier published, calculated data.

引用

页码：2657 / 2659

页数：3