X-RAY PHOTOEMISSION-STUDIES OF ATOM IMPLANTED MATRICES - CU, AG, AND AU IN SIO2

被引：20

作者：

YOUNG, VY ^{[1
]}

GIBBS, RA ^{[1
]}

WINOGRAD, N ^{[1
]}

机构：

[1] PURDUE UNIV,DEPT CHEM,W LAFAYETTE,IN 47907

来源：

JOURNAL OF CHEMICAL PHYSICS | 1979年 / 70卷 / 12期

关键词：

D O I：

10.1063/1.437450

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

X-ray photoelectron spectroscopy has been used to study the electronic structure of Cu,Ag, and Au atoms implanted in SiO2. In each case the valence levels shifted to higher binding energy and narrowed compared to the bulk metals, approaching the expected shape of the gas phase free atom spectra. A model is presented which allows calculation of photoemission and Auger energies from atomic spectra, and is shown to accurately predict the observed spectra. © 1979 American Institute of Physics.

引用

页码：5714 / 5721

页数：8

共 57 条

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