A PARALLEL PLATE RESONATOR TECHNIQUE FOR MICROWAVE LOSS MEASUREMENTS ON SUPERCONDUCTORS

被引:180
作者
TABER, RC
机构
关键词
D O I
10.1063/1.1141389
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A simple method for the evaluation of microwave surface loss of superconductive samples is discussed. The method allows the evaluation of small (∼1 cm×∼1 cm), flat samples over a broad range of temperatures. It can accurately characterize samples with surface resistances as low as 5 μΩ or as high as 1 mΩ at 10 GHz. In addition to high resolution, it has several advantages: sample preparation requirements are minimal; the current distribution within the sample under test is relatively uniform and can be accurately calculated; no other superconducting or normal conducting material is required for the resonator, so no additional corrections for such materials are needed; and the procedure is comparatively rapid and can be performed in the necktube of a liquid-helium storage Dewar.
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页码:2200 / 2206
页数:7
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