ELECTRON-DIFFRACTION STUDIES OF STRAIN IN EPITAXIAL BICRYSTALS AND MULTILAYERS

被引：51

作者：

CHERNS, D

KIELY, CJ

PRESTON, AR

机构：

来源：

关键词：

D O I：

10.1016/0304-3991(88)90127-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：355 / 370

页数：16

共 20 条

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KALISKI, RW
LUDOWISE, MJ
DIETZE, WT
LEWIS, CR
[J]. APPLIED PHYSICS LETTERS, 1984, 44 (12) : 1158 - 1160
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