ELECTRICAL CHARACTERIZATION OF METAL-SEMICONDUCTOR INTERFACES

被引：8

作者：

BARRET, C

LU, GN

NEFFATI, T

机构：

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1987年 / 22卷 / 11期

关键词：

D O I：

10.1051/rphysap:0198700220110148500

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1485 / 1493

页数：9

共 42 条

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[3]

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[9]

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