FIELD EMISSION MICROSCOPE AND FLASH FILAMENT TECHNIQUES FOR THE STUDY OF STRUCTURE AND ADSORPTION ON METAL SURFACES

被引：107

作者：

BECKER, JA

HARTMAN, CD

机构：

来源：

关键词：

D O I：

10.1021/j150503a006

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：153 / 159

页数：7

共 8 条

[1] SURFACE PHENOMENA USEFUL IN VACUUM TECHNIQUE
APKER, LR
[J]. INDUSTRIAL AND ENGINEERING CHEMISTRY, 1948, 40 (05): : 846 - 847
[2] EXTENSION OF THE LOW PRESSURE RANGE OF THE IONIZATION GAUGE
BAYARD, RT
ALPERT, D
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (06) : 571 - 572
[3] THE USE OF THE FIELD EMISSION ELECTRON MICROSCOPE IN ADSORPTION STUDIES OF W ON W AND BA ON W
BECKER, JA
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1951, 30 (04): : 907 - 932
[4] BECKER JA, 1951, JUN AM PHYS SOC M SC
[5] JENKINS RO, 1943, REPORTS PROGR PHYSIC, V9, P177
[6] MOLNAR JP, 1950, APR MIT PHYS EL C
[7] Muller EW, 1936, PHYS Z, V37, P838
[8] [No title captured]