DIRECT X-RAY DETERMINATION OF ELECTRON-DENSITY PROFILE OF NERVE MYELIN MEMBRANE, WITH PARACRYSTALLINE LATTICE-DISTORTIONS TAKEN INTO ACCOUNT

被引：5

作者：

GBORDZOE, MK

KREUTZ, W

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1978年 / 11卷 / OCT期

关键词：

D O I：

10.1107/S0021889878013692

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

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收藏

页码：489 / 495

页数：7

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