IONICITY EFFECTS ON DEFECTS IN CHALCOGENIDE ALLOYS

被引：47

作者：

STREET, RA

LUCOVSKY, G

机构：

[1] Xerox Palo Alto Research Center Palo Alto

来源：

SOLID STATE COMMUNICATIONS | 1979年 / 31卷 / 05期

关键词：

D O I：

10.1016/0038-1098(79)90540-4

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The ionicity of compound chalcogenide and oxide glasses can modify the defect properties. Charged, valence alternation defects remain, but may not have a negative correlation energy because interconversion of positive and negative defects is inhibited. This property substantially changes the electronic behavior. The experimental evidence indicates that defects of this type occur in GeSe2 and SiO2 glasses, but not in As2Se3. © 1979.

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页码：289 / 293

页数：5

相关论文

共 19 条

[1] MODEL FOR ELECTRONIC-STRUCTURE OF AMORPHOUS-SEMICONDUCTORS [J].

ANDERSON, PW .

PHYSICAL REVIEW LETTERS, 1975, 34 (15) :953-955

[2]

HAYES GA, 1978, PHYS REV B, V18, P6900

[3]

Huggins M. L., 1953, J AM CHEM SOC, V75, P4123, DOI [DOI 10.1021/JA01113A001, 10.1021/ja01113a001]

[4] CHARGE-CARRIER TRANSPORT PHENOMENA IN AMORPHOUS SIO2 - DIRECT MEASUREMENT OF DRIFT MOBILITY AND LIFETIME [J].

HUGHES, RC .

PHYSICAL REVIEW LETTERS, 1973, 30 (26) :1333-1336

[5] VALENCE-ALTERNATION MODEL FOR LOCALIZED GAP STATES IN LONE-PAIR SEMICONDUCTORS [J].

KASTNER, M ;

ADLER, D ;

FRITZSCHE, H .

PHYSICAL REVIEW LETTERS, 1976, 37 (22) :1504-1507

[6] DEFECT CHEMISTRY OF LONE-PAIR SEMICONDUCTORS [J].

KASTNER, M ;

FRITZSCHE, H .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1978, 37 (02) :199-215

[7] TIME OF FLIGHT MEASUREMENT OF CARRIER MOBILITY IN GEXSE1-X GLASSES [J].

KIM, GI ;

SHIRAFUJI, J .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (10) :1789-1794

[8] OPTIC MODES IN AMORPHOUS AS2S3 AND AS2SE3 [J].

LUCOVSKY, G .

PHYSICAL REVIEW B, 1972, 6 (04) :1480-&

[9] COORDINATION DEPENDENT VIBRATIONAL PROPERTIES OF AMORPHOUS-SEMICONDUCTOR ALLOYS [J].

LUCOVSKY, G ;

NEMANICH, RJ ;

SOLIN, SA ;

KEEZER, RC .

SOLID STATE COMMUNICATIONS, 1975, 17 (12) :1567-1572

[10]

LUCOVSKY G, PHIL MAG