FUNDAMENTAL LIMITATIONS OF SWITCHED-CAPACITOR SIGMA-DELTA MODULATORS

被引:21
作者
DIAS, VF [1 ]
PALMISANO, G [1 ]
OLEARY, P [1 ]
MALOBERTI, F [1 ]
机构
[1] JOANNEUM RES,ELECTR SENSOR INTERFACES GRP,GRAZ,AUSTRIA
来源
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | 1992年 / 139卷 / 01期
关键词
SWITCHED CAPACITOR; MODULATORS;
D O I
10.1049/ip-g-2.1992.0006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In recent years oversampling techniques have become very popular for implementing high resolution analogue-to-digital (A/D) convertors. To obtain high resolution the order of the modulator L and the oversampling ratio M are commonly seen as degrees of freedom since no theoretical limit exists for the maximum achievable signal-to-quantisation-noise ratio (SNR). However, in practical cases two fundamental constraints need to be considered in the design of the modulator, namely the thermal noise generated by the switches and the amplifiers and the settling error due to finite values of the gain-bandwidth product and the slew rate. The paper presents a closed form relation for the SNR performance of generic L-order N-bit modulators designed with switched-capacitor (SC) techniques. The relation takes into account all the above constraints. One of the major conclusions is that state-of-the-art 2nd-order SC modulators are sufficient to achieve competitive SNR performance.
引用
收藏
页码:27 / 32
页数:6
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