STACKING-FAULTS AND MICROSTRAIN IN LA1.85M0.15CUO4 (M = CA, BA, SR) BY ANALYZING X-RAY-DIFFRACTION LINE BROADENING

被引：2

作者：

BALZAR, D ^{[1
]}

LEDBETTER, H ^{[1
]}

ROSHKO, A ^{[1
]}

机构：

[1] UNIV ZAGREB, FAC MET, DEPT PHYS, YU-44000 SISAK, YUGOSLAVIA

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1991年 / 185卷

关键词：

D O I：

10.1016/0921-4534(91)91659-R

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We obtained x-ray diffraction patterns for three oxides: La1.85M0.15CuO4 (M = Ca, Ba, Sr). The superconductors show zero-resistance T(c) values of 19, 28, and 36 K, respectively. Diffraction-line profiles were fit with a convolution of specimen and instrumental functions. The specimen line-broadening angular dependence was analyzed by the Warren-Averbach method of real Fourier coefficients. Stacking-fault probability increases with increasing T(c); microstrain decreases.

引用

页码：871 / 872

页数：2