THE EFFECTS OF ANNEALING ON MAGNETIC DOMAIN-STRUCTURE AND INTERFACE PROFILE IN SPUTTERED FE/CR MULTILAYER FILMS

被引:14
作者
PETFORDLONG, AK
DOOLE, RC
CEREZO, A
CONYERS, JS
JAKUBOVICS, JP
机构
[1] Department of Materials, University of Oxford, Oxford
关键词
D O I
10.1016/0304-8853(93)90559-K
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Changes in the microstructure and magnetic domain structure of sputtered Fe/Cr multilayers were recorded during in situ heating in an electron microscope. The films showed different behaviour for different Cr spacer layer thicknesses. Three-dimensional chemical information from position sensitive atom probe microanalysis showed improved Fe/Cr interface smoothness after annealing.
引用
收藏
页码:117 / 120
页数:4
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