APPARATUS FOR MEASURING TEMPERATURE DEPENDENCE OF PHOTO-HALL EFFECTS IN HIGH-RESISTIVITY PHOTOCONDUCTORS

被引：3

作者：

MACDONALD, HE

BUBE, RH

机构：

来源：

关键词：

D O I：

10.1063/1.1717942

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：721 / &

相关论文

共 4 条

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[3] DESIGN OF DYNAMIC CONDENSER ELECTROMETERS
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SWANK, RK
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[4] PUTLEY EH, 1960, HALL EFFECT RELATED, P47