SHORT HALF-LIFE MEASUREMENTS USING A PAIR OF SEMICONDUCTOR DETECTORS

被引：3

作者：

BISHOP, RJ ^{[1
]}

机构：

[1] KINGSTON POLYTECH,SCH PHYS,KINGSTON,SURREY,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS | 1973年 / 107卷 / 01期

关键词：

D O I：

10.1016/0029-554X(73)90004-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：9 / 11

页数：3

共 8 条

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[5] HALF-LIFE MEASUREMENTS OF 86.6 KEV LEVEL IN PA-233 AND 59.6 KEV LEVEL IN NP-237 [J].

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CHAUHAN, SD ;

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SAHA, NK .

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[6]

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[7]

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[8] A SINGLE VALUED TIME TO PULSE HEIGHT CONVERTER USING TUNNEL DIODES [J].

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NUCLEAR INSTRUMENTS & METHODS, 1965, 32 (01) :133-&

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