A SAPPHIRE RESONATOR FOR MICROWAVE CHARACTERIZATION OF SUPERCONDUCTING THIN FILMS

被引：53

作者：

Wilker, C. ^{[1
]}

Shen, Z-Y. ^{[1
]}

Nguyen, V. X. ^{[1
]}

Brenner, M. S. ^{[1
]}

机构：

[1] Dupont Co, Expt Stn, Wilmington, DE 19880 USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1993年 / 3卷 / 01期

关键词：

D O I：

10.1109/77.233621

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A simple technique has been developed for the high frequency characterization of superconducting thin films. A microwave resonator is formed by sandwiching a high purity c-axis oriented sapphire rod between a pair of superconducting thin films. For the TE011 resonant mode, the theoretical treatment allows for the surface resistance and the RF current density to be calculated from the unloaded Q-value and the dissipated power. This technique is especially useful since it has: no sample preparation; no calibration; great sensitivity; great accuracy; great repeatability; great dynamic range; high internal power levels with only moderate input power levels; and broad temperature coverage (4.2 to over 120 K). A round robin experiment using four HTS thin films was performed to deconvolute the films' surface resistance and also to provide a statistical analysis of the method's reproducibility. The standard error for a single measurement is better than 2%. In addition, a measurement of a Nb thin film was made as a verification of the technique.

引用

页码：1457 / 1460

页数：4

共 9 条

[1] HIGH-Q TUNABLE SAPPHIRE LOADED CAVITY RESONATOR FOR CRYOGENIC OPERATION [J].