ELECTRONIC PROPERTIES OF CADMIUM SULFIDE THIN-FILMS FOLLOWING LOW-ENERGY HELIUM ION-BOMBARDMENT

被引：2

作者：

AMBRIDGE, T

CARTER, G

机构：

来源：

关键词：

D O I：

10.1016/0040-6090(72)90192-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：255 / &

共 9 条

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