ELECTROLUMINESCENCE IN ANTHRACENE CRYSTALS CAUSED BY FIELD-INDUCED MINORITY-CARRIERS AT MODERATE TEMPERATURES

被引:15
作者
HWANG, W [1 ]
KAO, KC [1 ]
机构
[1] UNIV MANITOBA, ELECT ENGN DEPT, MAT RES LAB, WINNIPEG, MANITOBA, CANADA
关键词
D O I
10.1063/1.1679685
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:3521 / 3522
页数:2
相关论文
共 26 条
[1]   INJECTION-DETERMINED DARK-CURRENTS IN ANTHRACENE SINGLE CRYSTALS [J].
BECKER, G ;
RIEHL, N ;
BAESSLER, H .
PHYSICS LETTERS, 1966, 20 (03) :221-&
[2]  
Brodzeli M. I., 1970, Fizika i Tekhnika Poluprovodnikov, V4, P954
[3]  
DRESNER J, 1969, RCA REV, V30, P322
[4]   ANTHRACENE ELECTROLUMINESCENT CELLS WITH TUNNEL-INJECTION CATHODES [J].
DRESNER, J ;
GOODMAN, AM .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (11) :1868-&
[5]   TRIPLET EXCITION-TRAPPED HOLE INTERACTION IN ANTHRACENE CRYSTALS [J].
ERN, V ;
BOUCHRIHA, H ;
FOURNY, J ;
DELACOTE, G .
SOLID STATE COMMUNICATIONS, 1971, 9 (14) :1201-+
[6]   EXCIMER AND DEFECT STRUCTURE FOR ANTHRACENE AND SOME DERIVATIVES IN CRYSTALS THIN FILMS AND OTHER FILMS AND OTHER RIGID MATRICES [J].
FIELDING, PE ;
JARNAGIN, RC .
JOURNAL OF CHEMICAL PHYSICS, 1967, 47 (01) :247-&
[7]   SPACE-CHARGE-LIMITED CURRENT INSTABILITIES IN N+-PI-N+ SILICON DIODES [J].
HAGENLOCHER, AK ;
CHEN, WT .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1969, 13 (05) :533-+
[8]   FLUORESCENCE AND DEFECT FLUORESCENCE OF ANTHRACENE AT 4.2 DEGREES K [J].
HELFRICH, W ;
LIPSETT, FR .
JOURNAL OF CHEMICAL PHYSICS, 1965, 43 (12) :4368-&
[9]   TRANSIENTS OF VOLUME-CONTROLLED CURRENT AND OF RECOMBINATION RADIATION IN ANTHRACENE [J].
HELFRICH, W ;
SCHNEIDER, WG .
JOURNAL OF CHEMICAL PHYSICS, 1966, 44 (08) :2902-+
[10]   RECOMBINATION RADIATION IN ANTHRACENE CRYSTALS [J].
HELFRICH, W ;
SCHNEIDE.WG .
PHYSICAL REVIEW LETTERS, 1965, 14 (07) :229-&