STRUCTURAL STUDY OF A-SI1-XCX-H BY EXAFS AND X-RAY-SCATTERING

被引:37
作者
MENEGHINI, C
PASCARELLI, S
BOSCHERINI, F
MOBILIO, S
EVANGELISTI, F
机构
[1] UNIV LAQUILA,DIPARTIMENTO ENERGET,I-67100 LAQUILA,ITALY
[2] UNIV ROME LA SAPIENZA,DIPARTMENTO FIS,I-00185 ROME,ITALY
关键词
D O I
10.1016/S0022-3093(05)80060-2
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We present a comprehensive study of short range order in a-Si1-xCx:H using X-ray scattering and Si K-edge EXAFS. The X-ray scattering probes the total radial distribution function; by detailed fitting in R-space we measure short range order parameters around C and Si for the first and second shell. The C-C distances in first and second shell indicate that both carbidic and graphitic configurations are present. The coordination numbers indicate that there is a tendency to chemical order; at high C concentrations there is evidence for chemical order with phase separation. The EXAFS measurements probe local order in the Si-C alloy phase; there is clear evidence that even this phase is chemically ordered.
引用
收藏
页码:75 / 78
页数:4
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