IMPERFECTIONS IN SOLUTION-GROWN BETA-SILICON CARBIDE CRYSTALS

[1] AMELINCKX S, 1964, DIRECT OBSERVATIO S6

[2] BARTLETT RW, 1967, J ELECTROCHEM SOC, V114, P1149

[3] BATHA HD, 1962, NOW610676C CONTR

[4] X-RAY METHOD FOR DETERMINATION OF POLARITY OF SIC CRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) : 3560 - &

[5] FAUST JW, 1965, T METALL SOC AIME, V233, P230

[6] HALDEN FA, 1960, SILICON CARBIDE HIGH, P115

[7] HIRSCH PB, 1965, ELECTRON MICROSCOPY

[8] KOHN JA, 1962, AM MINERAL, V47, P1005

[9] DIRECT OBSERVATION OF INDIVIDUAL DISLOCATIONS BY X-RAY DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) : 597 - 598

[10] STACKING-FAULT CONTRAST IN X-RAY TOPOGRAPHS OF ANNEALED SI WEB DENDRITE [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (09) : 3495 - &

[1] AMELINCKX S, 1964, DIRECT OBSERVATIO S6

[2] BARTLETT RW, 1967, J ELECTROCHEM SOC, V114, P1149

[3] BATHA HD, 1962, NOW610676C CONTR

[4] X-RAY METHOD FOR DETERMINATION OF POLARITY OF SIC CRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) : 3560 - &

[5] FAUST JW, 1965, T METALL SOC AIME, V233, P230

[6] HALDEN FA, 1960, SILICON CARBIDE HIGH, P115

[7] HIRSCH PB, 1965, ELECTRON MICROSCOPY

[8] KOHN JA, 1962, AM MINERAL, V47, P1005

[9] DIRECT OBSERVATION OF INDIVIDUAL DISLOCATIONS BY X-RAY DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) : 597 - 598

[10] STACKING-FAULT CONTRAST IN X-RAY TOPOGRAPHS OF ANNEALED SI WEB DENDRITE [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (09) : 3495 - &