THRESHOLD FOR RADIATION EFFECTS IN SILICA

被引：27

作者：

PRIMAK, W ^{[1
]}

机构：

[1] ARGONNE NATL LAB,ARGONNE,IL 60439

来源：

PHYSICAL REVIEW B | 1972年 / 6卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.6.4846

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：4846 / 4851

页数：6

共 17 条

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[3]

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[4]

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[7] IONIZATION EXPANSION OF PILE-EXPOSED VITREOUS SILICA [J].

PRIMAK, W ;

KAMPWIRT.R .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (06) :2565-&

[8] DETERMINATION OF SMALL DILATATIONS AND SURFACE STRESS BY BIREFRINGENCE MEASUREMENTS [J].

PRIMAK, W .

SURFACE SCIENCE, 1969, 16 :398-&

[9] IONIZATION EXPANSION OF PRESSURE-COMPACTED VITREOUS SILICA [J].

PRIMAK, W ;

KAMPWIRTH, R .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (02) :685-+

[10] MECHANISM FOR RADIATION COMPACTION OF VITREOUS SILICA [J].

PRIMAK, W .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (06) :2745-+

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