DEFLECTION OF AN 800 GEV PARTICLE BEAM USING CHANNELING

被引：13

作者：

BAKER, SI

CARRIGAN, RA

DIXON, RL

FENKER, HC

STEFANSKI, RJ

FORSTER, JS

WIJAYAWARDANA, RL

REUCROFT, S

机构：

[1] SUNY ALBANY,ALBANY,NY 12222

[2] CERN,CH-1211 GENEVA 23,SWITZERLAND

[3] ATOM ENERGY CANADA LTD RES CO,CHALK RIVER NUCL LABS,CHALK RIVER K0J 1J0,ONTARIO,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1986年 / 248卷 / 2-3期

关键词：

D O I：

10.1016/0168-9002(86)91013-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：301 / 308

页数：8

共 17 条

[1]

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SALMAN, S ;

SUN, CR ;

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WIJAYAWARDANA, R ;

FORSTER, JS ;

HATTON, H ;

MITCHELL, IV ;

GUZIK, Z ;

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ELLISON, JA ;

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[3] 1ST OPERATION WITH A CRYSTAL SEPTUM TO REPLACE A MAGNET IN A CHARGED-PARTICLE BEAM [J].

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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 234 (03) :602-605

[4]

CARRIGAN RA, 1980, FN8045 FERM

[5]

ELLISON JA, 1982, NUCL PHYS B, V206, P205, DOI 10.1016/0550-3213(82)90531-4

[6] GEV CHANNELING IN BENT CRYSTALS WITH SLOWLY VARYING CURVATURE [J].

ELLISON, JA ;

BAKER, SI ;

CARRIGAN, RA ;

FORSTER, JS ;

MITCHELL, IV ;

GIBSON, WM ;

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SALMAN, S ;

SUN, CR ;

WIJAYAWARDANA, R .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3) :9-12

[7]

HEIJNE E, 1981, SILICON DETECTORS HI, P16

[8]

KILLIANY J, 1981, SILICON DETECTORS HI, P275

[9] PLANAR DECHANNELING OF GEV PARTICLES IN A BENT CRYSTAL [J].

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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 189 (2-3) :609-614

[10]

MENZIONE A, 1981, SILICON DETECTORS HI, P224

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