HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPE AT JOHNS HOPKINS

被引：20

作者：

WIGGINS, JW

ZUBIN, JA

BEER, M

机构：

[1] Department of Biophysics, Johns Hopkins University, Baltimore

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1979年 / 50卷 / 04期

关键词：

D O I：

10.1063/1.1135840

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The scanning transmission electron microscope constructed at Johns Hopkins follows the general layout of the first instrument at the University of Chicago. It is currently operating at 50 kV with a resolution of about 3 Å. Its detector scheme consists of scintillation crystals coupled to photomultipliers in such a way as to eliminate introduction of unnecessary statistical noise. A unique alignment scheme utilizes the spherical aberration of the objective lens.

引用

页码：403 / 410

页数：8

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