RESISTIVITY OF THIN GOLD-FILMS

被引：8

作者：

SAMBLES, JR

ELSOM, KC

JARVIS, DJ

机构：

[1] Department of Physics, University of Exeter, Devon

来源：

SOLID STATE COMMUNICATIONS | 1979年 / 32卷 / 11期

关键词：

D O I：

10.1016/0038-1098(79)90814-7

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Results are obtained on the D.C. electrical resistivity of evaporated gold films on KBr substrates as a function of thickness and temperature. These show that the conduction electrons are not specularly reflected at the sample surface but nevertheless the temperature dependent part of the resistivity is independent of sample thickness. Comparison of the results with Fuchs-Sondheimer theory for the effects of sample thickness upon the resistivity yield a maximum specularity of approximately 0.64 for <100> films on KBr. © 1979.

引用

页码：997 / 1000

页数：4

共 12 条

[1] SCHICHTDICKENBESTIMMUNG UND ELEKTRISCHE LEITFAHIGKEIT METALLISCHER AUFDAMPFSCHICHTEN [J].