THE DIFFRACTION PATTERNS OF CRYSTALS WITH LAYER DEFECTS

被引：6

作者：

BERLINER, R ^{[1
]}

GOODING, RJ ^{[1
]}

机构：

[1] QUEENS UNIV,DEPT PHYS,KINGSTON K7L 3N6,ONTARIO,CANADA

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1994年 / 50卷

关键词：

D O I：

10.1107/S0108767393007871

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A method for the calculation of X-ray and neutron diffraction profiles of crystals with layer defects is described. Averages over a computer model of a configurational ensemble of crystallites with defects are used to define the scattering cross section. The method easily accommodates the modeling of complex defect geometries or correlations. Diffracted intensity profiles for the NixAl1-x(5, 2BAR) monoclinic martensite, trigonal polytypes and body-centered-cubic crystals are presented as examples.

引用

页码：98 / 106

页数：9

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