MEASUREMENT OF THE DERIVATIVES OF CURVED SURFACES USING SPECKLE INTERFEROMETRY

A novel speckle interferometry method to measure the slope change variations of a curved surface is described. The method is simple to implement and provides controllable sensitivity. This latter also encourages the use of mask technique, incorporated with image analysis and phase-shifting procedures, as a way to improve upon the range of sensitivities. that one can obtain with the electronic speckle pattern interferometry technique.