SOFT-X-RAY SOURCE FOR PHOTOELECTRON SPECTROSCOPY

被引：10

作者：

MCLACHLAN, AD ^{[1
]}

LECKEY, RC ^{[1
]}

JENKIN, JG ^{[1
]}

LIESEGANG, J ^{[1
]}

机构：

[1] LA TROBE UNIV, PHYS DEPT, BUNDOORA 3083, VICTORIA, AUSTL.

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 07期

关键词：

D O I：

10.1063/1.1686267

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：873 / 876

页数：4

相关论文

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[3] WINDOWLESS PHOTOELECTRON SPECTROMETER FOR HIGH RESOLUTION STUDIES OF SOLIDS AND SURFACES
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[4] ABSOLUTE INTENSITY MEASUREMENTS OF THE CARBON AND ALUMINIUM X-RAY K-LINES WITH A PROPORTIONAL COUNTER
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[5] EFFICIENCY OF PRODUCTION OF CHARACTERISTIC X-RADIATION IN THICK TARGETS OF A PURE ELEMENT
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[6] ANGULAR DISTRIBUTION OF CHARACTERISTIC X RADIATION + ITS ORIGIN WITHIN SOLID TARGET
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[7] HAGSTROM SBM, TO BE PUBLISHED
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[9] JENKINS RO, 1962, INT J ELECTRON, V12, P1
[10] KEMENY PC, TO BE PUBLISHED