Ferromagnetic resonance techniques have been used to evaluate the magnetic parameters in thin films of YIG type materials, YIG disk films having thickness from 0. 39 to 1. 15 mu m and diameters from 250 to 1000 mu m and grownby CVD on GGG substrates were investigated. Abstract of Paper 59. 4, presented at the 1972 INTERMAG Conference, Kyoto, Japan, April 10-13.