SCANNING ELECTRON-DIFFRACTION SYSTEM FOR IN-SITU ALKALI ANTIMONIDE PHOTOCATHODE STUDIES

被引:3
作者
BECK, AH
ROBBIE, JC
机构
关键词
D O I
10.1080/00207217208938372
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:361 / &
相关论文
共 11 条
[1]  
Decker R, 1969, ADV ELECTRONICS EL A, V28, P357
[2]   SCANNING ELECTRON DIFFRACTION WITH ENERGY ANALYSIS [J].
DENBIGH, PN ;
GRIGSON, CWB .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (05) :305-&
[3]   MODIFIED DETECTION ARRANGEMENT FOR SCANNING ELECTRON DIFFRACTION INSTRUMENT [J].
DOVE, DB ;
DENBIGH, PN .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (12) :1687-&
[4]   ON SCANNING ELECTRON DIFFRACTION .2. [J].
GRIGSON, CWB ;
TILLETT, PI .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1968, 24 (02) :101-&
[5]   IMPROVED SCANNING ELECTRON DIFFRACTION SYSTEM [J].
GRIGSON, CWB .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (11) :1587-&
[6]  
GRIGSON CWB, 1965, NATURE, V192, P647
[7]  
HERITAGE MB, 1968, THESIS U CAMBRIDGE
[8]   SIMPLE ELECTRON DIFFRACTION CAMERA FOR EXAMINATION OF ALKALI ANTIMONIDE PHOTOELECTRIC FILMS [J].
MCCARROLL, WH ;
SIMON, RE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (04) :508-&
[9]  
NINOMIYA T, 1969, ADV ELECTRON ELECT A, V28, P337
[10]  
Scherrer P., 1918, PHYS REV, V2, P98