ELD - A COMPUTER-PROGRAM SYSTEM FOR EXTRACTING INTENSITIES FROM ELECTRON-DIFFRACTION PATTERNS

A computer program system, ELD, for extracting intensities from electron diffraction (ED) patterns has been developed. ELD runs on a personal computer (PC). Electron diffraction patterns are digitized using a CCD camera, and the data is transferred to the PC via a frame grabber. The lattice vectors and the shape and size of the diffraction spots are first determined, and based upon this information the strategy for extracting the electron diffraction intensities is decided by ELD. It is possible to merge several diffraction patterns taken with different exposure times, whereby both very strong and very weak reflections can be measured. Quantified electron diffraction data can be useful both for chemical applications, such as refining crystal structures, previously solved by crystallographic image processing (CIP), in materials science and for physical applications,